Current quality control processes in wafer fabs only allow for after-the-fact detection of excursions, causing significant yield loss. Those processes also involve frequent measurements at every step of the process, increasing cycle times and reducing overall throughput.
Lynceus provides real-time, actionable insights on the quality of every wafer driving both yield and throughput improvements.
Wafer sort yield prediction
Early detection of wafer sort excursions
Virtual metrology testing on 100% of production
Accelerated root cause analysis and recipe optimization