{"id":758,"date":"2023-04-20T04:26:50","date_gmt":"2023-04-20T08:26:50","guid":{"rendered":"https:\/\/www.lynceus.ai\/?p=758"},"modified":"2023-04-20T04:26:50","modified_gmt":"2023-04-20T08:26:50","slug":"semi-engineering-using-ai-to-improve-metrology-tooling","status":"publish","type":"post","link":"https:\/\/www.lynceus.ai\/semi-engineering-using-ai-to-improve-metrology-tooling\/","title":{"rendered":"Semi Engineering: Using AI to Improve Metrology Tooling"},"content":{"rendered":"<p>Lynceus is proud to be featured in Semi Engineering&#8217;s latest article: how can AI support metrology improvements, and what are the associated challenges?<\/p>\n<p>Find out more here: <a href=\"https:\/\/semiengineering.com\/using-ai-to-improve-metrology-tooling\/\">https:\/\/semiengineering.com\/using-ai-to-improve-metrology-tooling\/<\/a><\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Lynceus is proud to be featured in Semi Engineering&#8217;s latest article: how can AI support metrology improvements, and what are the associated challenges? 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